SANS / IEC 61000-4-11

Voltage Dips, Interruptions and Variations

SANS / IEC 61000-4-11

SANS / IEC 61000-4-11 defines the immunity test methods and range of preferred test levels for electrical and electronic equipment connected to low-voltage power supply networks for voltage dips, short interruptions, and voltage variations. The scope of SANS / IEC 61000-4-11 is to establish a common reference for evaluating the immunity of electrical and electronic equipment when subjected to voltage dips, short interruptions and voltage variations.

SANS / IEC 61000-4-11 states that electrical and electronic equipment may be affected by voltage dips, short interruptions or voltage variations of power supply. Voltage dips and short interruptions are caused by faults in the network, primarily short circuits, in installations or by sudden large changes of load. These phenomena are random in nature and can be minimally characterized for the purpose of laboratory simulation in terms of the deviation from the rated voltage and duration.

Typical levels

  • Any phase angle of input
    0%, 40%, 70% and 80% of nominal voltage
  • Duration 0.5 to 250
    50Hz cycle periods